Attached files
file | filename |
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8-K - CURRENT REPORT - AEHR TEST SYSTEMS | aehr_8k.htm |
Exhibit 99.1
Contacts:
Aehr Test Systems
Ken
Spink
Chief
Financial Officer
(510)
623-9400 x309
|
MKR Investor Relations Inc.
Todd
Kehrli or Jim Byers
Analyst/Investor
Contact
(323) 468-2300
aehr@mkr-group.com
|
Aehr Test Systems Appoints Technology Industry Veteran
Fariba Danesh to its Board of Directors
Fremont, CA (May 14, 2021) – Aehr Test Systems (NASDAQ:
AEHR), a worldwide
supplier of semiconductor test and reliability qualification
equipment, today announced it has appointed Fariba Danesh to
its board of directors, effective May 10, 2021.
Ms.
Danesh is a technology industry veteran, with 30 years of
executive-level technology and
operating leadership in multiple enterprise and consumer hardware
markets, with special emphasis on semiconductor, photonics,
telecommunications, and data storage. She is currently COO
at PsiQuantum, a quantum computing startup based in Palo Alto, CA
that is using silicon photonics to build the world's first useful
quantum computer, applying existing semiconductor and photonics
manufacturing processes.
Gayn
Erickson, President and CEO of Aehr Test Systems, commented,
“Fariba brings incredible
knowledge, experience, and contacts in the compound semiconductor
and optical semiconductor spaces. She is intimately aware of the
challenges and critical requirements for stabilization and burn-in
of these optical semiconductors and the unique value that
Aehr’s wafer level, singulated die and module test solutions
bring to reliability testing. We are excited to have her join our
Board.”
Ms. Danesh said, “I am very excited to be joining the Aehr
Test Systems Board. With the unique capabilities of its test and
burn-in solutions, particularly for the silicon carbide and silicon
photonic markets, Aehr is well positioned to address the
significant market opportunities ahead.”
Prior
to joining PsiQuantum in January 2021, Ms. Danesh served for nine
years as CEO of Glo AB, a
venture-funded photonics/compound semiconductor company that
designs and develops semiconductor light-emitting diodes at levels
of brightness suitable for general illumination applications. Prior
to that, she was SVP, General Manager Fiber Optics Products
Division of Avago Technologies (now Broadcom) for three years,
where she had complete P&L responsibility for a $400 million
annual revenue photonics business. Previous to that she served in
senior executive positions at several leading technology companies,
including EVP of Global Operations for
Maxtor, a $3 billion annual revenue data storage company, COO
of Finisar Corporation, one of the top three fiber optic
communication product companies in the world, and CEO/COO of Genoa
Corporation, a III-V semiconductor
optical amplifier company.
With the appointment of Ms. Danesh, Aehr Test now has seven board
members.
About Aehr Test Systems
Headquartered
in Fremont, California, Aehr Test Systems is a worldwide provider
of test systems for burning-in and testing logic, optical and
memory integrated circuits and has installed over 2,500 systems worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and
FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP
WaferPak Contactor, FOX DiePak® Carrier and FOX
DiePak Loader. The ABTS system is used in production and
qualification testing of packaged parts for both lower power and
higher power logic devices as well as all common types of memory
devices. The FOX-XP and FOX-NP systems are full wafer contact and
singulated die/module test and burn-in systems used for burn-in and
functional test of complex devices, such as leading-edge memories,
digital signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
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